AOI Automated Optical Inspection
In recent years, Industry 4.0, AI and edge computing have become more mature. FIT combines the internal supply chain and R&D resources of Foxlink Group, integrating image and optical technology with AI algorithms.
Since 2018, FIT has participated in Industry 4.0 development, cooperated new projects and published academic presentations with the Industrial Technology Research Institute (ITRI), Taiwan Textile Research Institute (TTRI), Taiwan Textile Federation, etc. We began to get involved in Big data analysis and developed defect inspection equipment.
We first launched "Eagle-Eye Intelligent Full-color Optical Inspection Equipment“.
Since 2018, FIT has participated in Industry 4.0 development, cooperated new projects and published academic presentations with the Industrial Technology Research Institute (ITRI), Taiwan Textile Research Institute (TTRI), Taiwan Textile Federation, etc. We began to get involved in Big data analysis and developed defect inspection equipment.
We first launched "Eagle-Eye Intelligent Full-color Optical Inspection Equipment“.
Eagle-EyeIntelligent Full-color Optical Inspection Equipment
Application field
Suitable for all kinds of production lines quality inspection such as
Suitable for all kinds of production lines quality inspection such as
- Textile industry/dyeing and finishing
(grey fabric, non-woven fabric, artificial leather, etc...) - PCB copper foil substrates
- All kinds of films
- Wafer surface defects
- Flat glass, etc...
Advantages
High integration
● Integrated design of full-color optical sensor and lens
● Embedded modules. High-cost graphics cards and industrial computers are no need.
● Integrated design of full-color optical sensor and lens
● Embedded modules. High-cost graphics cards and industrial computers are no need.
AI Software
● AI software can be installed in the computer
● Defects re-judgment and classified
● AI software can be installed in the computer
● Defects re-judgment and classified
High color accuracy
● Full-color/multi-spectrum scanning (RGB CCD sensor), wide defect detection range
● Multiple flash exposure technology, detect defect in different light source at the same time
● Module linearity calibration (CCD) can effectively detect wide-range aberration defects.
● Defects stitching is available to inspect large-sized defects.
● Integrate with encoder and output defect map
● Full-color/multi-spectrum scanning (RGB CCD sensor), wide defect detection range
● Multiple flash exposure technology, detect defect in different light source at the same time
● Module linearity calibration (CCD) can effectively detect wide-range aberration defects.
● Defects stitching is available to inspect large-sized defects.
● Integrate with encoder and output defect map
Lightweight
● L x W x H: 260mm x 148mm x 255mm
● Weight: 6kgs
● Multiple merge
● L x W x H: 260mm x 148mm x 255mm
● Weight: 6kgs
● Multiple merge
